Photoelectric conversion device and manufacturing method thereof

ABSTRACT

A photoelectric conversion device with a novel anti-reflection structure. In the photoelectric conversion device, a front surface of a semiconductor substrate which serves as a light-receiving surface is covered with a group of whiskers (a group of nanowires) so that surface reflection is reduced. In other words, a semiconductor layer which has a front surface where crystals grow so that whiskers are formed is provided on the light-receiving surface side of the semiconductor substrate. The semiconductor layer has a given uneven structure, and thus has effects of reducing reflection on the front surface of the semiconductor substrate and increasing conversion efficiency.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a photoelectric conversion device. Oneembodiment of the disclosed invention includes a back contact elementstructure.

2. Description of the Related Art

A solar cell in which a single crystal silicon substrate or apolycrystalline silicon substrate is used for a photoelectric conversionlayer has been developed as one of photoelectric conversion devices. Insuch a solar cell, an uneven structure is formed on a front surface ofthe silicon substrate in order to reduce surface reflection. This unevenstructure is formed by etching the silicon substrate with an alkalinesolution such as NaOH. An alkaline solution has different etching ratesdepending on crystal plane orientations of silicon. Thus, for example,when a silicon substrate which has a crystal plane orientation of (100)is etched, a pyramidal uneven structure is formed. Back contact solarcells which have such an uneven structure have been proposed (e.g.,Patent Document 1 and Patent Document 2).

However, etching with an alkaline solution contaminates a siliconsubstrate, and thus is not suitable. In addition, etchingcharacteristics greatly vary depending on the concentration ortemperature of an alkaline solution, which makes it difficult to form anuneven structure with high reproducibility. In view of the above, amethod in which etching with an alkaline solution and a laser processingtechnique are combined has been proposed (e.g., Patent Document 3).

However, even by the method disclosed in Patent Document 3, it isdifficult to form an uneven structure by etching, for example, in thecase where a thin film is used as a photoelectric conversion layer.

REFERENCE

-   [Patent Document 1] Japanese Published Patent Application No.    2002-164556-   [Patent Document 2] Japanese Published Patent Application No.    2006-080450-   [Patent Document 3] Japanese Published Patent Application No.    2003-258285

SUMMARY OF THE INVENTION

Etching a photoelectric conversion layer itself in order to form theabove uneven structure is not preferable for the following reasons: aproblem with controllability for the uneven structure is caused and thecharacteristics of a solar cell are adversely affected. Moreover, analkaline solution and a large amount of rinse water is needed for theetching; thus, attention needs to be paid to contamination. For thatreason, such etching is not preferable also in terms of productivity.

In view of the above, an object of one embodiment of the presentinvention is to provide a photoelectric conversion device with a novelanti-reflection structure.

A semiconductor surface which serves as a light-receiving surface iscovered with a group of whiskers (also referred to as nanowires) so thatsurface reflection is reduced. In other words, a semiconductor layerwith a front surface where crystals grow so that whiskers are formed isprovided on the light-receiving surface side of a semiconductorsubstrate. The semiconductor layer has a given uneven structure, andthus has an effect of reducing reflection on the front surface of thesemiconductor substrate.

One embodiment of the present invention is a photoelectric conversiondevice. The photoelectric conversion device includes a semiconductorsubstrate; a group of whiskers which is formed of a crystallinesemiconductor and is provided on a front surface of the semiconductorsubstrate; an n⁺ region and a p⁺ region which are provided on the backsurface side of the semiconductor substrate; a first electrode which iselectrically connected to the n⁺ region; and a second electrode which iselectrically connected to the p⁺ region.

Another embodiment of the present invention is a photoelectricconversion device. The photoelectric conversion device includes asemiconductor substrate; a group of whiskers which is formed of acrystalline semiconductor and is provided on a front surface of thesemiconductor substrate; an n⁺ region and a p⁺ region which are providedon the back surface side of the semiconductor substrate; a firstelectrode which is electrically connected to the n⁺ region; a secondelectrode which is electrically connected to the p⁺ region; and aninsulating film which is provided on the group of whiskers.

Note that whiskers are formed in such a manner that crystals of asemiconductor material grow so as to have column-like protrusions orneedle-like protrusions on the front surface of the semiconductorsubstrate.

Further, the n⁺ region is an n-type impurity region (also referred to asan n-type region) in which impurity elements imparting n-typeconductivity are contained at high concentration; the p⁺ region is ap-type impurity region (also referred to as a p-type region) in whichimpurity elements imparting p-type conductivity are contained at highconcentration. Note that the term “high concentration” means the casewhere the carrier density of each region is higher than the carrierdensity of the semiconductor substrate.

The semiconductor layer which is grown so as to have whiskers asdescribed above functions as an anti-reflection layer. Thus, light lossdue to reflection on a light-receiving surface can be reduced andconversion efficiency can be increased.

Further, when an uneven structure on a light-receiving surface is formedwith the use of a special semiconductor coating film which is grown byvapor deposition without etching with an alkaline solution unlike aconventional method, contamination of a semiconductor substrate can beprevented and productivity can be increased.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A to 1C illustrate structures of a photoelectric conversiondevice.

FIGS. 2A to 2C illustrate a manufacturing method of a photoelectricconversion device.

FIGS. 3A and 3B illustrate the manufacturing method of the photoelectricconversion device.

FIG. 4 illustrates a structure of the photoelectric conversion device.

FIG. 5 shows structures of whiskers.

FIG. 6 shows reflectance of whiskers.

FIGS. 7A and 7B illustrate structures of the photoelectric conversiondevice.

DETAILED DESCRIPTION OF THE INVENTION

Embodiments of the present invention disclosed will be described belowwith reference to the drawings. However, the present invention is notlimited to the following description, and it is easily understood bythose skilled in the art that the modes and details of the presentinvention can be changed in various ways without departing from thespirit and scope of the present invention. Therefore, the presentinvention disclosed should not be construed as being limited to thedescription in Embodiments below.

In Embodiments hereinafter described, the same parts are denoted withthe same reference numerals throughout the drawings. Note that thethickness, the width, a relative position, and the like of components,that is, layers, regions, and the like illustrated in the drawings areexaggerated in some cases for clarification in the description of theembodiments.

Embodiment 1

In this embodiment, structural examples of a photoelectric conversiondevice will be described.

FIGS. 1A to 1C illustrate structural examples of a photoelectricconversion device.

The photoelectric conversion device includes a semiconductor substrate102 and receives light from the front surface (also referred to aslight-receiving surface) side of the semiconductor substrate 102. In oneembodiment of the present invention, the photoelectric conversion devicehas an uneven structure for reducing reflection of incident light 150 ona front surface of the semiconductor substrate 102. The structure willbe specifically described below.

A group of whiskers 114 is formed on the front surface of thesemiconductor substrate 102 as the uneven structure. The group ofwhiskers 114 can reduce surface reflection of the incident light 150 onthe light-receiving surface. The group of whiskers 114 will bespecifically described below.

FIG. 1B is an enlarged view of the group of whiskers 114.

As illustrated in FIG. 1B, the group of whiskers 114 includes acrystalline semiconductor region 114 a which covers the semiconductorsubstrate 102 and a whisker-like crystalline semiconductor region 114 bwhich is formed over the crystalline semiconductor region 114 a. Thewhiskers are formed in such a manner that crystals of a semiconductormaterial (e.g., silicon) grow so as to have column-like or needle-likeprotrusions 114 c. The group of whiskers 114 has a plurality of thecolumn-like or needle-like protrusions 114 c.

Here, an interface between the crystalline semiconductor region 114 aand the crystalline semiconductor region 114 b is not clear. Therefore,the plane that is at the same level as the bottom of the deepest valleyof the valleys formed among the protrusions 114 c and is parallel to thefront surface of the semiconductor substrate 102 is regarded as theinterface between the crystalline semiconductor region 114 a and thecrystalline semiconductor region 114 b.

Examples of the specific shape of the protrusion 114 c include acolumn-like shape such as a cylindrical shape or a prismatic shape, aneedle-like shape such as a conical shape or a polygonal pyramid shape,and the like. The top of the protrusion 114 c may be rounded. Thediameter of the protrusion 114 c is greater than or equal to 50 mm andless than or equal to 10 μm, preferably greater than or equal to 500 nmand less than or equal to 3 μm. The length h along the axis of theprotrusion 114 c is greater than or equal to 0.5 μm and less than orequal to 1000 μm, preferably greater than or equal to 1.0 μm and lessthan or equal to 100 μm.

Note that the length h along the axis of the protrusion 114 c is thedistance between the top (or the center of the top surface) of theprotrusion 114 c and the crystalline semiconductor region 114 a alongthe axis running through the top (or the center of the top surface) ofthe protrusion 114 c.

Further, the thickness of the group of whiskers 114 is the sum of thethickness of the crystalline semiconductor region 114 a and thethickness of the crystalline semiconductor region 114 b. Here, thethickness of the crystalline semiconductor region 114 b is the length ofthe line which perpendicularly runs from the top of the protrusion 114 cto the crystalline semiconductor region 114 a (i.e., the height of theprotrusion 114 c).

Further, the diameter of the protrusion 114 c is the length of a longaxis in a transverse cross-sectional shape of the protrusion 114 c atthe interface between the crystalline semiconductor region 114 a and thecrystalline semiconductor region 114 b.

Note that the direction in which the protrusion 114 c extends from thecrystalline semiconductor region 114 a is referred to as a longitudinaldirection and the cross-sectional shape along the longitudinal directionis referred to as a longitudinal cross-sectional shape. In addition, theshape of the plane normal to the longitudinal direction is referred toas a transverse cross-sectional shape.

In FIG. 1B, the longitudinal directions of the protrusions 114 c extendin one direction, for example, in the direction normal to the frontsurface of the crystalline semiconductor region 114 a. Note that thelongitudinal direction of the protrusion 114 c may be substantially thesame as the direction normal to the front surface of the crystallinesemiconductor region 114 a. In that case, it is preferable that thedifference in angle between the two directions be typically within 5°.The longitudinal direction of the protrusion 114 c is substantially thesame as the direction normal to the front surface of the crystallinesemiconductor region 114 a as described above; therefore, FIG. 1Billustrates only the longitudinal cross-sectional shape of theprotrusions 114 c.

As another example, the longitudinal directions of a plurality ofprotrusions may vary as illustrated in FIG. 1C. Typically, thecrystalline semiconductor region 114 b may include a first protrusion124 a whose longitudinal direction is substantially the same as thenormal direction and a second protrusion 124 b whose longitudinaldirection is different from the normal direction. Moreover, the lengthalong the axis of the second protrusion 124 b may be greater than thelength along the axis of the first protrusion 124 a. The longitudinaldirections of the plurality of protrusions vary as described above;therefore, the longitudinal cross-sectional shapes of the protrusionsand the transverse cross-sectional shape of the protrusion (i.e., aregion 114 d) coexist in FIG. 1C.

Optical characteristics of such a group of whiskers will be describedwith reference to FIG. 6. FIG. 6 is a graph showing the wavelengthdependence of regular reflectance of a titanium foil and a sampleincluding a group of silicon whiskers having a polycrystalline structureon the titanium foil.

A sample 1 whose reflectance is represented by a dotted line in FIG. 6is a titanium foil which is cut in a circle with a diameter φ of 12 mmand has a thickness of 0.1 mm. In addition, a sample 2 whose reflectanceis represented by a solid line is formed in such a manner that apolysilicon layer including a group of whiskers is formed over thetitanium foil with a diameter φ of 12 mm and a thickness of 0.1 mm,which are similar to those of the sample 1, by an LPCVD method. Thepolysilicon layer here is formed by introducing silane for depositionfor 2 hours and 15 minutes at a flow rate of 300 sccm into a processchamber in which the pressure is set to 13 Pa and the substratetemperature is set to 600° C.

The regular reflectance was measured by a spectrophotometer (U-4100Spectrophotometer, manufactured by Hitachi High-TechnologiesCorporation). Here, the samples 1 and 2 were irradiated with lighthaving wavelengths from 200 nm to 1200 nm with a sampling interval of 2nm. In addition, the reflectance was measured under the condition thatthe angle of incident light on each sample was 5° (i.e., 5-degreeregular reflectance was measured). The horizontal axis represents thewavelength of the irradiation light and the vertical axis represents thereflectance of the irradiation light.

According to FIG. 6, the sample 2 in which the polysilicon layerincluding the group of whiskers is formed on the surface of the titaniumfoil has an extremely low reflectance as can be seen from its regularreflectance of 0% to 0.15%, which means that there is almost no lightreflection. Note that since the SN ratio is small in the wavelengthrange of 850 nm to 894 nm, the reflectance is negative. In contrast, thesample 1 that is the titanium foil has a regular reflectance of 2% to15%. The results show that the reflectance can be reduced by forming thepolysilicon layer including the group of whiskers on the surface of thetitanium foil.

As is clear from the characteristics shown in FIG. 6, when the group ofwhiskers 114 is provided, the surface reflectance of visible light inthe entire wavelength range can be reduced to be less than or equal to10%, preferably less than or equal to 5%.

An n⁺ region 104 and a p⁺ region 106 are formed on the back surface sideof the semiconductor substrate 102. In addition, an electrode 110 and anelectrode 112 are formed on the n⁺ region 104 and the p⁺ region 106,respectively. Note that a p-type substrate is used as the semiconductorsubstrate 102.

In other words, a photoelectric conversion element including theelectrode 110, the n⁺ region 104, the p-type semiconductor substrate102, the p⁺ region 106, and the electrode 112 is formed on the backsurface side of the semiconductor substrate 102. The photoelectricconversion device has one or more of the photoelectric conversionelements. Here, the p-type semiconductor substrate 102 (also referred toas a p region) serves as an active layer.

Thus, according to one embodiment of the photoelectric conversiondevice, electrical contacts are made on the back surface (the surfaceopposite to the light-receiving surface). The photoelectric conversiondevice has a so-called back contact structure. Note that withoutlimitation to the back contact structure, the photoelectric conversiondevice may have a group of whiskers on the light-receiving surface, asdescribed above.

Note that an insulating film 108 may be formed on a back surface of thesemiconductor substrate 102. In that case, through contact holes formedin the insulating film 108, the n⁺ region 104 and the electrode 110 areelectrically connected to each other, and the p⁺ region 106 and theelectrode 112 are electrically connected to each other.

Silicon or germanium is typically used for the semiconductor substrate102. Alternatively, a compound semiconductor such as gallium arsenide orindium phosphide may be used. Note that a single crystal semiconductorsubstrate or a polycrystalline semiconductor substrate can be used asthe semiconductor substrate 102. For example, the p-type semiconductorsubstrate contains an impurity element imparting p-type conductivity,such as boron. Note that an n-type semiconductor substrate may be used;for example, a substrate which contains an impurity element impartingn-type conductivity, such as phosphorus, is used. In addition, asubstrate in a plate form or a thin film form can be used as thesemiconductor substrate 102.

Further, a p⁻ region 200 may be provided between the p-typesemiconductor substrate 102 (p region) and the n⁺ region 104 so that ann⁺/p⁻/p/p⁺ structure in which the impurity concentration varies in theactive layer is formed (FIG. 7A). This structure allows the diffusionlength of minority carriers to be increased by an internal electricfield generated in the p⁻ region; thus, short-circuit current can beincreased.

Alternatively, a p⁻ region 200 may be provided between the p-typesemiconductor substrate 102 (p region) and the p⁺ region 106 so that ann⁺/p/p⁻/p⁺ structure in which the impurity concentration varies in theactive layer (FIG. 7B) is formed. This structure allows a high-resistantp⁻ region to be provided between the p region and the p⁺ region and anenergy difference between the active layer and the p⁺ region to beincreased; thus, open voltage can be increased. Further, an n⁻ regionmay be provided between the n⁺ region and the p-type semiconductorsubstrate.

Note that the short-circuit current is current at the time when thevoltage applied to the outside is 0 V and the open voltage is voltage atthe time when the current flowing to the outside is 0 A. Each of theshort-circuit current and the open voltage is one of the characteristicsfor determining the performance of a solar cell. The performance of asolar cell can be improved by increasing the short-circuit current andthe open voltage.

Further, the n⁺ region 104 is an n-type impurity region (also referredto as an n-type region) in which impurity elements imparting n-typeconductivity are contained at high concentration; the p⁺ region 106 is ap-type impurity region (also referred to as a p-type region) in whichimpurity elements imparting p-type conductivity are contained at highconcentration. Further, an n⁻ region is an n-type impurity region inwhich impurity elements imparting n-type conductivity are contained atlow concentration; a p⁻ region is a p-type impurity region in whichimpurity elements imparting p-type conductivity are contained at lowconcentration. Note that the term “high concentration” means the casewhere the carrier density of each region is higher than the carrierdensity of the semiconductor substrate 102, whereas the term “lowconcentration” means the case where the carrier density of each regionis lower than the carrier density of the semiconductor substrate 102.

This embodiment can be combined with any of the other embodiments asappropriate.

Embodiment 2

In this embodiment, an example of a manufacturing method of aphotoelectric conversion device will be described.

A metal layer 103 is formed on the front surface (a light-receivingsurface) of the semiconductor substrate 102 (FIG. 2A).

Here, a p-type single crystal silicon substrate is used as thesemiconductor substrate 102. Note that an n-type substrate may be used.

It is preferable that the metal layer 103 be formed to have an extremelysmall thickness of approximately several nanometers. The extremely smallthickness of the metal layer 103 makes it possible to suppressabsorption or reflection of incident light from the front surface of thesemiconductor substrate 102 by the metal layer 103. Here, the thicknessof the metal layer 103 is greater than or equal to 1 nm and less than orequal to 10 nm.

Further, it is preferable that metal materials contained in the metallayer 103 be dispersed homogeneously in the front surface of thesemiconductor substrate 102 and be held.

The metal layer 103 is formed by a sputtering method or the like withthe use of a metal material typified by platinum, aluminum, copper,titanium, or an aluminum alloy to which silicon, titanium, neodymium,scandium, molybdenum, or the like is added. Note that a metal materialwhich forms silicide by reacting with silicon is preferably used. Whenthe metal layer 103 becomes silicide, light reflection can be reduced.

Alternatively, the metal layer 103 may be formed by a method by which asolution containing any of the metal materials is applied onto the frontsurface of the semiconductor substrate 102. By this method, theconcentration of the metal material in the solution can be controlled,which enables the metal layer 103 to be thin. In addition, the metalmaterials contained in the metal layer 103 can be dispersedhomogeneously.

Next, the n⁺ region 104 and the p⁺ region 106 are formed on the backsurface side of the semiconductor substrate 102 (FIG. 2A).

The n⁺ region 104 can be formed by adding an impurity element impartingn-type conductivity (e.g., phosphorus or arsenic) by doping or the likewith the use of a mask.

The p⁺ region 106 can be formed by adding an impurity element impartingp-type conductivity (e.g., aluminum or boron) by doping or the like withthe use of a mask.

Next, an insulating film 107 is formed on the back surface of thesemiconductor substrate 102 in which the n⁺ region 104 and the p⁺ region106 are formed (FIG. 2B).

The insulating film 107 is a silicon oxide film or the like andfunctions as a protective film for the semiconductor substrate 102. Theinsulating film 107 can protect the semiconductor substrate 102 when agroup of whiskers is formed later.

Next, a group of whiskers 114 formed of a crystalline semiconductor isformed over the metal layer 103 (FIG. 2B). An example in whichcrystalline silicon is grown to have whiskers will be described below.

The group of whiskers 114 is formed by a low pressure chemical vapordeposition method (also referred to as an LPCVD method).

The LPCVD method is performed using a source gas containing silicon (thesemiconductor material) while heating is performed. The heatingtemperature is set higher than 550° C. and lower than or equal to thetemperature that an LPCVD apparatus and the semiconductor substrate 102can withstand, preferably higher than or equal to 580° C. and lower than650° C. In addition, the pressure in a reaction chamber of the LPCVDapparatus is set higher than the lower limit of the pressure that can beheld with the source gas supplied and lower than or equal to 200 Pa.Examples of the source gas containing silicon include silicon hydride,silicon fluoride, and silicon chloride; typically, SiH₄, Si₂H₆, SiF₄,SiCl₄, Si₂Cl₆, and the like are given. Note that hydrogen may beintroduced into the source gas.

Since the group of whiskers 114 can be formed by a vapor depositionmethod, the semiconductor substrate 102 is not contaminated. For thatreason, it can be said that the vapor deposition method is superior to amethod of forming an uneven structure by etching the semiconductorsubstrate 102.

In such a manner, the structure of the group of whiskers 114, which isdescribed in Embodiment 1, can be formed.

FIG. 5 is a planar scanning electron microscope (SEM) image of the groupof whiskers 114. As shown in FIG. 5, crystalline silicon obtained in theabove process includes a large number of column-like protrusions orneedle-like protrusions. A long protrusion has a length of approximately15 μm to 20 μm along its axis. In addition to the long protrusions, aplurality of short protrusions exists. Some protrusions have axes thatare substantially perpendicular to the metal layer 103, and otherprotrusions have axes that are oblique to the metal layer 103. Note thata titanium film is used as the metal layer 103 in FIG. 5.

Next, the insulating film 107 formed on the back surface of thesemiconductor substrate 102 is removed with hydrofluoric acid or thelike.

Next, insulating films 108 are formed on the surface of the group ofwhiskers 114 and the back surface of the semiconductor substrate 102(FIG. 2C). The insulating film 108 is a silicon nitride film or the likeand functions as a passivation film.

After that, contact holes are formed in the insulating film 108 formedon the back surface of the semiconductor substrate 102, whereby the n⁺region 104 and the p⁺ region 106 are exposed (FIG. 3A).

The contact holes can be formed by irradiating the insulating film 108with laser light, by etching with the use of a mask, or the like.

Then, an electrode 110 and an electrode 112 that are electricallyconnected to the n⁺ region 104 and the p⁺ region 106, respectively, areformed by a screen printing method, an evaporation method, or the like(FIG. 3B).

Note that the electrode 110 and the electrode 112 can be formed using anelement selected from aluminum, silver, titanium, tantalum, tungsten,molybdenum, and copper, or an alloy material or a compound materialwhich mainly contains any of the elements. Alternatively, a stack ofthese materials may be used.

Through the above process, the photoelectric conversion device can bemanufactured.

Note that the metal layer 103 may be removed by gettering. As thegettering, for example, heat treatment is performed at temperatureshigher than or equal to 800° C. and lower than or equal to 1150° C. inan oxidizing atmosphere containing a halogen element. Specifically, heattreatment may be performed at 950° C. in an atmosphere containing oxygenand hydrogen chloride at 3%. The metal layer 103 is removed bygettering, which allows the amount of incident light to be increased.Alternatively, the metal layer 103 may be etched with hydrofluoric acidor the like.

This embodiment can be combined with any of the other embodiments asappropriate.

Embodiment 3

In this embodiment, an example of a manufacturing method of aphotoelectric conversion device, which is different from themanufacturing method described in Embodiment 2, will be described.

In Embodiment 2, the metal layer 103 is formed in a film form on thefront surface of the semiconductor substrate 102.

In contrast, in this embodiment, an island-shaped metal layer is formedon the front surface of the semiconductor substrate 102, instead of themetal layer 103 illustrated in FIG. 2A. The island-shaped metal layermay be formed by a screen printing method, an evaporation method, or thelike.

Accordingly, in a photoelectric conversion device after manufacture, anisland-shaped metal layer 116 is provided between the front surface ofthe semiconductor substrate 102 and the group of whiskers 114 (FIG. 4).When the island-shaped metal layer 116 is formed, reflection or the likecan be reduced as compared to the case where a metal layer is formedover the entire surface of the semiconductor substrate.

Other steps and the like are similar to those described in Embodiment 2.

This embodiment can be combined with any of the other embodiments asappropriate.

This application is based on Japanese Patent Application serial no.2010-139799 filed with the Japan Patent Office on Jun. 18, 2010, theentire contents of which are hereby incorporated by reference.

What is claimed is:
 1. A photoelectric conversion device comprising: asemiconductor substrate having a front surface and a back surface,wherein the back surface of the semiconductor substrate is provided withan n-type impurity region and a p-type impurity region; a metal layerover the front surface; a plurality of whiskers over the metal layer,wherein the plurality of whiskers comprises a crystalline semiconductor;a first electrode on the n-type impurity region; a second electrode onthe p-type impurity region, wherein each of the plurality of thewhiskers comprises a protrusion with a diameter of greater than or equalto 500 nm and less than or equal to 3 μm, and a length of greater thanor equal to 1 μm and less than or equal to 100 μm, and wherein areflectance of the plurality of the whiskers is less than or equal to5%.
 2. A photoelectric conversion device according to claim 1, furthercomprising: an insulating film formed over the plurality of whiskers. 3.A photoelectric conversion device according to claim 1, wherein then-type impurity region contains an n-type impurity element added by adoping method, and wherein the p-type impurity region contains a p-typeimpurity element added by a doping method.
 4. A photoelectric conversiondevice according to claim 1, wherein the p-type impurity regioncomprises a first p-type impurity region and a second p-type impurityregion, and wherein a first impurity concentration of the first p-typeimpurity region is different from a second impurity concentration of thesecond p-type impurity region.
 5. A photoelectric conversion devicecomprising: a semiconductor substrate having a front surface and a backsurface, wherein the back surface of the semiconductor substrate isprovided with an n-type impurity region and a p-type impurity region; ametal layer over the front surface; a plurality of whiskers over themetal layer, wherein the plurality of whiskers comprises a crystallinesemiconductor; an insulating film on the n-type impurity region and thep-type impurity region; a first electrode on the insulating film; and asecond electrode on the insulating film, wherein the first electrode iselectrically connected to the n-type impurity region through a contacthole in the insulating film, wherein the second electrode iselectrically connected to the p-type impurity region through a contacthole in the insulating film, wherein each of the plurality of thewhiskers comprises a protrusion with a diameter of greater than or equalto 500 nm and less than or equal to 3 μm, and a length of greater thanor equal to 1 μm and less than or equal to 100 μm, and wherein areflectance of the plurality of the whiskers is less than or equal to5%.
 6. A photoelectric conversion device according to claim 5, furthercomprising: an insulating film formed over the plurality of whiskers. 7.A photoelectric conversion device according to claim 5, wherein then-type impurity region contains an n-type impurity element added by adoping method, and wherein the p-type impurity region contains a p-typeimpurity element added by a doping method.
 8. A photoelectric conversiondevice according to claim 5, wherein the p-type impurity regioncomprises a first p-type impurity region and a second p-type impurityregion, and wherein a first impurity concentration of the first p-typeimpurity region is different from a second impurity concentration of thesecond p-type impurity region.
 9. The photoelectric conversion deviceaccording to claim 1, wherein the metal layer is any one selected in agroup of platinum, aluminum, copper, titanium, and an aluminum.
 10. Thephotoelectric conversion device according to claim 5, wherein the metallayer is any one selected in a group of platinum, aluminum, copper,titanium, and an aluminum.